#
Structure
characterisation

Structure characterisation

 
Scanning Electron Microscope (SEM)
Profilometry
Atomic Force Microscopy (AFM)  
 








 
 
Example
 
mikro_struktur.gif Structure characterisation

Because we have access to very modern and complex measuring equipment installed in a clean room we can offer a variety of structure characterisation services.
 


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Contact us

Supracon AG
An der Lehmgrube 11
07751 Jena
Germany

Tel.: +49-3641-2328100
Fax.: +49-3641-2328109

info(at)supracon.com